The NEW Cilas Nano DS combines dynamic light scattering and static light scattering measurement in a single optical system. This breakthrough technology makes nano particle characterization more accurate than ever. The Nano DS particle size analyzer provides you with the best accuracy, repeatability and resolution over the entire range of 0.3 nm to 10 microns.
For information on the theory behind the Nano DS particle size analyzer, please click here.
Cilas Nano DS features multi-angle analysis
Come and see our solutions at the following trade shows:
NanoTech 2013
Tokyo, Japan
Jan 30 - Feb 1, 2013
Rutgers ORA Research Technologies Expo
Rugters, NJ
February 13, 2013
Pittcon 2013
Booth 1106
Philadelphia, PA
March 17 - 21, 2013
ACeRS Regional Refractories
Show
St. Louis, MO
March 27 - 28, 2013
NanoTech Conference and Expo
Washington, DC
May 12 - 15, 2013
AchemAsia 2013
Beijing, China
May 13 - 16, 2013
Chicago Catalyst Show
Chicago, IL
May 2013
Southeast Catalyst Show
Asheville, NC
September 2013
American Association of Pharmaceutical Scientists Show
